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Job Title: Senior Design for Test (DFT) EngineerBaya SystemsBengaluru, IndiaSenior level OnlyTHIS ROLE IS DESIGNED FOR MINIMUM 10 YEARS OF INDUSTRY EXPERIENCEPLEASE BE ADVISED WE WONT REPOND TO UNQUALIFIED RESUMES AT THIS TIME.NO ENTRY LEVEL OR RCG/NCGWe are seeking a highly experienced Senior Design for Test (DFT) Engineer to architect and implement a comprehensive DFT strategy for complex System-on-Chip (SoC) designs. The ideal candidate will lead the end-to-end DFT architecture for large-scale SoCs featuring multi-domain clocking, multiple power domains, embedded memory macros, and high-speed SERDES interfaces. This role requires deep expertise in scan architecture, MBIST, LBIST, boundary scan, hierarchical DFT methodologies, and test integration for advanced technology nodes.Key Responsibilities:DFT Architecture & StrategyArchitect and own the complete DFT strategy for complex SoCs.Define top-level DFT specifications including Scan architecture (full-scan, hierarchical scan, compression) Test access mechanisms (TAM) IEEE 1149.x (JTAG), 1500, 1687 (IJTAG) implementation, On-chip clock controllers (OCC),Define DFT micro-architecture for multi-clock, multi-voltage domain designsDevelop test strategies for complex clocking schemes including PLLs, clockmuxing, and gated clocks.Scan & ATPG ImplementationImplement scan insertion (including scan compression) and DFT integration.Drive ATPG generation, coverage closure, and pattern validation.Debug coverage issues and perform root-cause analysis for DRC/ATPG failures. Optimize test time, coverage, and pattern count.Memory BISTArchitect and integrate MBIST solutions for large numbers of embedded memory macros.Define memory repair strategies (redundancy, fuse programming)Support silicon bring-up and yield analysis related to memory and logic test.SERDES & High-Speed IO TestDefine DFT and production test strategies for high-speed SERDES blocks.Support loopback test modes, PRBS generation/checking, BERT support.Ensure testability of analog/mixed-signal interfaces where applicable.Collaborate with PHY and AMS teams to define structural and functional test coverage.Clocking & Power Domain Test StrategyDevelop DFT solutions for:◦ Multiple clock domainsAsynchronous clock crossings◦ Power-gated domainsIsolation and retention logicImplement safe test modes and low-power test methodologiesPhysical & Implementation CollaborationWork closely with RTL, Physical Design, STA, and Power teamsDrive DFT-aware floorplanning and test routing strategies.Resolve test timing issues and congestion related to scan chains and compression logicSilicon Bring-Up & Production SupportSupport first silicon bring-up and test program correlation.Analyze silicon failures and provide DFT-related debug.Drive yield improvement initiatives through test enhancement.Work with ATE teams on pattern deployment and debug.Leadership & Cross-Functional CollaborationMentor junior DFT engineers.Lead DFT reviews and sign-off processes.Collaborate across design, verification, physical, and product engineering teams.Influence architecture decisions to improve testability early in the design cycleRequired QualificationsBachelor’s or Master’s degree in Electrical Engineering, Computer Engineering, or related field.8+ years of hands-on DFT experience in complex SoC development.Proven experience architecting full-chip DFT for large SoCs.• Deep expertise in:◦ Scan insertion & compressionATPG (stuck-at, transition, path delay, bridging)◦ MBIST & memory repair flowsLBIST architecture◦ JTAG / IEEE 1149.x / 1500 / 1687Experience with multi-clock, multi-power domain DFT implementation.Strong knowledge of SERDES test methodologies.Proficiency in industry-standard DFT tools (e.g., Tessent, Synopsys DFTMAX/TestMAX, Cadence Modus)Strong debugging and silicon bring-up experience.• Experience with advanced nodes (FinFET or below preferred)rich.goldstein@